Signal and noise analysis for chiral structured illumination microscopy

نویسندگان

چکیده

Recently, chiral structured illumination microscopy has been proposed to image fluorescent domains at sub-wavelength resolution. Chiral is based on the combination of microscopy, fluorescence-detected circular dichroism, and optical chirality engineering. Since dichroism natural molecules typically weak, differential fluorescence also weak can be easily buried by noise, hampering fidelity reconstructed images. In this work, we systematically study impact noise quality resolution domain images obtained SIM. We analytically describe signal-to-noise ratio SIM in Fourier verify our theoretical calculations with numerical demonstrations. Accordingly, discuss feasibility different experimental scenarios propose possible strategies enhance for samples dichroism.

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ژورنال

عنوان ژورنال: Optics Express

سال: 2021

ISSN: ['1094-4087']

DOI: https://doi.org/10.1364/oe.425670